SBGBBG, a program to evaluate the macroscopic strain/stress tensor of a polycrystalline sample from X-ray reflection positions

Published: 01-01-1995| Version 1 | DOI: 10.17632/7cwvnn3mw7.1
T. Wieder


Abstract The evaluation of the strain/stress tensor from strain measured by X-ray diffraction requires a transformation from the sample system S to the laboratory system L. The transformation matrix A depends on the diffractometer geometry and the sample tilting. The conversion from strain to stress relies on poly-crystal elastic compliances S′_(mnop). The averaging is done about the orientation of the diffracting crystallites. The orientation distribution function (ODF) serves as weighting function... Title of program: SBGBBG Catalogue Id: ADAF_v1_0 Nature of problem Residual stresses in a polycrystalline sample cause changes in lattice plane distances which result in a shift of the X-ray reflections. The reflection shift depends on the measurement direction within the sample and therefore we can utilize the shift to evaluate the residual stress, i.e. the stress tensor. Versions of this program held in the CPC repository in Mendeley Data ADAF_v1_0; SBGBBG; 10.1016/0010-4655(94)00128-O This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)