General information

URL

http://data.mendeley.com/datasets/w99w5ythw8/8/files/3ac5142e-b724-45f5-94d7-3f1ddc12b8ae/ImplantationProfile_T_300K_110.dat?dl=1

Reference this file

Cite this dataset

Bringuier, Stefan; Abrams, Tyler; Rudakov, Dmitry; Unterberg, Ezekial; Holland, Leo; Vasudevamurthy, Gokul; Guterl, Jerome (2019), “Data for: Atomic Insight Into Concurrent He, D, and T Sputtering and Near-Surface Implantation of 3C-SiC Crystallographic Surfaces”, Mendeley Data, v8 http://dx.doi.org/10.17632/w99w5ythw8.8#file-778ecd91-fa94-4474-ae2d-457cdfd5e7c1

dat ImplantationProfile_T_300K_110.dat