WVM: A computer program for the determination of lattice parameters and strains in thin films

Published: 01-01-1996| Version 1 | DOI: 10.17632/wx92mbwb96.1
Contributor:
Thomas Wieder

Description

Abstract X-ray diffraction provides a method for the determination of the strain and stress tensor in a polycrystalline sample. The knowledge of the unstrained lattice parameters is a prerequisite to calculate strains from measured reflection shifts. For thin films a model exists to find the unstrained lattice parameters and the strain or stress tensor together from the measured reflection positions. Title of program: WVM Catalogue Id: ADDM_v1_0 Nature of problem Calculate the strain tensor epsilon 2<->and the strain-free lattice parameters of a thin polycrystalline film from measured X-ray reflection positions. Versions of this program held in the CPC repository in Mendeley Data ADDM_v1_0; WVM; 10.1016/0010-4655(96)00055-0 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)

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