2026-10-10T04:20:52Z https://data.mendeley.com/oai

oai:data.mendeley.com/dwk3778kgv.2 2026-07-14T22:03:11Z

Xu, Zhipeng Device-Wise Conformal Calibration of Nonnegative IGBT Remaining-Life Intervals for Power-Electronic Systems under Limited Accelerated-Aging Data Mendeley Data This dataset contains derived processed data, window manifests, model evaluation outputs, plotting figures, configuration files, and reproducibility scripts supporting a study on nonnegative remaining useful life (RUL) interval prediction for insulated-gate bipolar transistor (IGBT) prognostics under limited accelerated-aging data. The experiments use the public NASA IGBT accelerated-aging dataset and evaluate leave-one-device-out prediction, Deep Ensemble-TCN, Monte Carlo Dropout-TCN, GRU baselines, split conformal calibration, and device-wise conformal max calibration. This package does not redistribute the raw NASA source archive. The source data are publicly available from the NASA Open Data Portal: https://data.nasa.gov/dataset/insulated-gate-bipolar-transistor-igbt-accelerated-aging. NASA Open Data identifier: 7wwx-fk77. The included processed tables and result files support reproducibility of the manuscript tables, figures, and core interval-calibration comparisons. Computer Science Engineering Electrical Engineering Energy Engineering Dataset doi:10.17632/dwk3778kgv.2 oai:data.mendeley.com/dwk3778kgv.2 Creative Commons Attribution 4.0 International http://creativecommons.org/licenses/by/4.0 https://data.mendeley.com/datasets/dwk3778kgv 2026-07-14T22:03:11Z