2026-10-15T11:13:18Z https://data.mendeley.com/oai

oai:data.mendeley.com/fvd5k48mzp.1 2018-06-22T10:44:19Z

Sheikholeslam, Arash Data for: Hydrogen dissociation and diffusion near the Si < 111 > /a-SiO2 interface: understanding degradation in MOSFETs Mendeley Data Initial xyz data of Si/SiO2 interface with hydrogen passivated dangling bonds. Electrical Engineering Chemistry Materials Science grecu, Cristian Ivanov, Andre Manzano, Hegoi Dataset doi:10.17632/fvd5k48mzp.1 oai:data.mendeley.com/fvd5k48mzp.1 Creative Commons Attribution 4.0 International http://creativecommons.org/licenses/by/4.0 https://data.mendeley.com/datasets/fvd5k48mzp 2018-06-22T10:44:19Z