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    <responseDate>2026-10-15T09:38:34Z</responseDate>
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            <header>
                <identifier>oai:data.mendeley.com/mxtt9smvdv.1</identifier>
                <datestamp>2026-06-12T02:45:31Z</datestamp>
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            <metadata><oai_dc:dc xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
    <dc:creator>Uktamov, Jasur</dc:creator>
    <dc:title>ATR-FTIR spectroscopy raw data for YIG and BiIG thin films on SiO₂/Si substrates</dc:title>
    <dc:publisher>Mendeley Data</dc:publisher>
    <dc:description>This dataset contains raw ATR-FTIR spectroscopy data for yttrium iron garnet (YIG) and bismuth iron garnet (BiIG) thin films deposited on silicon substrates with a SiO₂ buffer layer by ion-beam sputtering.

IR spectra were recorded on a Nicolet iS50 Fourier-transform spectrometer (Thermo Fisher Scientific, USA) in the attenuated total reflection (ATR) mode using a built-in iS50 ATR accessory equipped with a diamond crystal. The sample was pressed against the working crystal of the accessory. The measurements were performed in the spectral range of 4000–400 cm⁻¹ (2.5–25 µm).

The first column is the wave number (cm⁻¹), the second column is the optical density (a.u.)</dc:description>
    <dc:subject>Spectroscopy</dc:subject>
    <dc:subject>Infrared Spectroscopy</dc:subject>
    <dc:subject>Optical Characterization of Thin Film</dc:subject>
    <dc:type>Dataset</dc:type>
    <dc:identifier>doi:10.17632/mxtt9smvdv.1</dc:identifier>
    <dc:identifier>oai:data.mendeley.com/mxtt9smvdv.1</dc:identifier>
    <dc:rights>Creative Commons Attribution 4.0 International</dc:rights>
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    <dc:relation>https://data.mendeley.com/datasets/mxtt9smvdv</dc:relation>
    <dc:date>2026-06-12T02:45:31Z</dc:date>
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