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    <responseDate>2026-10-15T21:09:10Z</responseDate>
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                <identifier>oai:data.mendeley.com/syjkdyzmxj.1</identifier>
                <datestamp>2026-09-29T13:02:42Z</datestamp>
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            <metadata><oai_dc:dc xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
    <dc:creator>Dera, Wojciech</dc:creator>
    <dc:title>Data for: Development of a novel nickel-based metal force microsensor using bottom-up approach</dc:title>
    <dc:publisher>Mendeley Data</dc:publisher>
    <dc:description>Measurement data behind the results of the article &quot;Development of a novel nickel-based metal force microsensor using bottom-up approach&quot; (W.J. Dera, H. Konopacka, D.M. Jarząbek, Precision Engineering 95 (2025) 251-261, https://doi.org/10.1016/j.precisioneng.2025.05.003).

The sensor is a capacitive comb force microsensor made of nanocrystalline nickel by electrodeposition into a photoresist mould (bottom-up process). The dataset contains:
- force-capacitance calibration (Fig. 7, Eq. 7): raw force of the reference transducer, raw AD7746 capacitance codes and every processing step (pairing, taring, time alignment, resampling, 5-sample moving average, trimming, linear fit);
- force-displacement points used to determine the spring constant (Fig. 8a, Eq. 8);
- capacitance drift under a constant load of about 2 N (Fig. 8b), raw codes and values in pF;
- stability records of the reference force transducer at 1 N and 2 N (Fig. 9);
- the screen capture of the capacitance anomaly between 3 and 5 N (Fig. 11) and microscope photographs of the out-of-plane rib deflection (Fig. 12);
- the image files of all twelve figures of the article.

README.txt describes every file, the columns and units, the instruments and the processing steps.</dc:description>
    <dc:subject>Nickel</dc:subject>
    <dc:subject>Sensor</dc:subject>
    <dc:subject>Microelectromechanical System Sensor</dc:subject>
    <dc:subject>Electrodeposition of Metals</dc:subject>
    <dc:subject>Instrument Calibration</dc:subject>
    <dc:contributor>Konopacka, Hanna</dc:contributor>
    <dc:contributor>Jarząbek, Dariusz</dc:contributor>
    <dc:type>Dataset</dc:type>
    <dc:identifier>doi:10.17632/syjkdyzmxj.1</dc:identifier>
    <dc:identifier>oai:data.mendeley.com/syjkdyzmxj.1</dc:identifier>
    <dc:rights>Creative Commons Attribution 4.0 International</dc:rights>
    <dc:rights>http://creativecommons.org/licenses/by/4.0</dc:rights>
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    <dc:date>2026-09-29T13:02:42Z</dc:date>
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