2026-10-12T15:08:36Z https://data.mendeley.com/oai

oai:data.mendeley.com/t8vvz6kx67.1 2018-10-12T15:03:19Z

Robles-Águila, M. J. Electrical measurements: STRUCTURAL, OPTICAL AND ELECTRICAL BEHAVIOR OF ZINC OXIDE/MWCNT COMPOSITE THIN FILMS Mendeley Data The electrical characterization was done at a low frequency (0.1 Hz), and the system was implemented by means of a Curve Tracer Module, a signal Generator (B & K Precision 4017A), and a two-channel oscilloscope (Tektronix TDS 2012C) Electrical Characterization of Thin Film Dataset doi:10.17632/t8vvz6kx67.1 oai:data.mendeley.com/t8vvz6kx67.1 Creative Commons Attribution 4.0 International http://creativecommons.org/licenses/by/4.0 https://data.mendeley.com/datasets/t8vvz6kx67 2018-10-12T15:03:19Z 2018-10-13T00:00:00Z