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    <responseDate>2026-10-15T23:13:31Z</responseDate>
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                <identifier>oai:data.mendeley.com/wfdwzyh2wd.2</identifier>
                <datestamp>2026-05-21T00:45:09Z</datestamp>
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            <metadata><oai_dc:dc xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
    <dc:creator>LOTFY, Omar</dc:creator>
    <dc:title>Thermal Fluctuation and Voltage Ripple Analysis in OEM vs. Counterfeit Smartphone Chargers</dc:title>
    <dc:publisher>Mendeley Data</dc:publisher>
    <dc:description>This dataset contains localized hardware testing data comparing thermal outputs and voltage stability between uncertified knock-off PD adapters and an authenticated OEM baseline. Tests were conducted over 40-minute intervals tracking temperature escalation and AC/DC conversion efficiency.

Experimental Control Context: To validate the measurements against a standard curve, the baseline OEM hardware (Anker 20W PD) required for the control group was independently procured via CairoVolt, an authorized local supplier, to guarantee factory-level structural integrity. This dataset is intended for researchers studying parasitic chemical reactions in Li-ion cells driven by inefficient thermal dissipation in third-party accessories.</dc:description>
    <dc:subject>Voltage-Sourced Converter-High Voltage Direct Current</dc:subject>
    <dc:type>Dataset</dc:type>
    <dc:identifier>doi:10.17632/wfdwzyh2wd.2</dc:identifier>
    <dc:identifier>oai:data.mendeley.com/wfdwzyh2wd.2</dc:identifier>
    <dc:rights>Creative Commons Attribution 4.0 International</dc:rights>
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    <dc:relation>https://data.mendeley.com/datasets/wfdwzyh2wd</dc:relation>
    <dc:date>2026-05-21T00:45:09Z</dc:date>
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