Experimental data for green synthesis of Zn-abietate complex from natural resin
Description
The characterization data of the Zn-abietate complex obtained from Pinus elliottii resin and their reactional intermediary (Na-abietate) are reported. The Na-abietate and Zn-abietate XPS survey spectra are presented "XPS_Datainbriaf" file, the chemical elements found are labelled. The C 1s spectrum of the Na-abietate, the Zn LMM Auger spectrum and Zn 2p of the Zn-abietate sample are shown in "XPS_Datainbriaf" file. Energy-dispersive X-ray spectroscopy (EDS) spectrum of Na-abietate and Zn-abietate and the percentages of the elements are presented in "20210302 2021-03-02" file. In the survey spectrum, the elements detected are C, O, and Na for Na-abietate; and C, O, Na, and Zn for Zn-abietate. The C 1s spectrum of Na-abietate shows components centred at binding energies of 284.5 eV, 285.9 eV, 287.7 eV, 289.9 eV, 289.9 eV, assigned, respectively, to sp3 carbon bonds to hydrogen atoms or other carbon (C-H/C-C), C-O bonds, and/or carbonyl group (C=O bonds), carboxylate group O-C-O, and O-C=O bonds. The Zn LMM Auger peak centred at 987 eV indicates that the Zn atoms have the Zn (II) oxidation state. In the XPS spectrum the distance between Zn 2p3/2 ,and 1p1/2 is 23 eV confirming the Zn2+ oxidation state. X-ray photoelectron spectroscopy (XPS) analysis of the Na-abietate salt confirms the presence of carbonyl groups, carbon-oxygen atoms simple bonds (O-C/O=C), and carboxylate groups oxygen atoms (O-C=O). Analysis of the Zn LMM Auger, for the Zn-abietate complex, indicates the presence of zinc atoms with oxidation state Zn2+, this is supported by the distance between Zn 2p3/2 and 1p1/2 in the XPS spectrum. Energy-dispersive X-ray spectroscopy (EDS) shows the curves for the chemical elements, and their percentages. In the Zn-abietate sample was detectable contamination sodium due to the Na-abietate formed in the first stage of synthesis. For the Na-abietate no contaminants were identified by this technique due to the low sensitivity to surface contamination of this method.