Fractal analysis of PILS layers excited in congruent doped (LiNbO3:Zn (0.018-2.05 wt.%)) and nominally pure stoichiometric single crystals by a laser radiation Р=110 mW, λо=532.0 nm

Published: 09-08-2019| Version 1 | DOI: 10.17632/2fw5t864fg.1
Contributor:
Diana Manukovskaya

Description

Congruent doped (LiNbO3:Zn (0.018-2.05 wt.%)) and nominally pure stoichiometric single crystals samples were irradiated by a laser radiation Р=110 mW, λо=532.0 nm perpendicular to a polar axis Z of a crystal. Due to photorefractive effect, a photoinduced light scattering (PILS) and a round scattering appeared on the exit face of crystal samples. PILS indicatrix opened and changes shape for some time, so the dynamics of the process was detected for 600 s. The patterns were shoot by a digital camera every 30 s, pictures of PILS patterns were separated into 6 illumination levels. A fractal analysis of an image of an each layer was calculated in a program Fractalyze, the dynamics of fractal dimension of PILS layers of the studied crystals are demonstrated in this dataset.

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