3D scanning data for pyramid sample
Published: 16 April 2021| Version 1 | DOI: 10.17632/2t8y5f54pz.1
Contributor:
Description
Point cloud data for EBM process printing surfaces. It has surface roughness and melt pool size change depending on the printing area due to heat accumulation. This data set is scanned by a customized ultra-high spatial resolution structured light scanner (5um).
Files
Steps to reproduce
The sample information is in the pptx file.
Institutions
Virginia Polytechnic Institute and State University
Categories
Point Cloud
Funding
TBD
Computational Modelling
| Objective of the Model | TBD |
| Typical Input | TBD |
| Typical output | TBD |
| Typical simulation movie | TBD |
| Computer System Requirements | TBD |
| Simulation ID | TBD |
Patents
| Patent Title | TBD |
| Patent Application | TBD |
AM Sample Data Template
| Sample ID | TBD |
| Date | 2021-04-12T16:00:00.000Z |
| Alloy Type | Ti-Base |
| Alloy composition | TBD |
| Alloy certificate | TBD |
| Process ID | TBD |
| Additive Manufacturing Process | E-PBF |
AM Process Data Template
| Additive Manufacturing Process | EBM |
| Process Parameters | TBD |
| Process Date | 2021-04-12T16:00:00.000Z |
| Process Description | TBD |
| CAD File | TBD |
| Process ID | TBD |
Research Process Flow
| Process Flow for Additive Manufacturing | TBD |
| Process Flow for Ex-situ Characterization | TBD |
| Process Flow for In-situ Characterization | TBD |
| Process Flow for Computational Modeling | TBD |
Software
| Available Software | TBD |
| Type | Commercial |
| Contact link | TBD |
Publications
| Sample ID | TBD |
| Publication Title | TBD |
| Citation | TBD |
| Authors | Rongxuan Wang, Zhenyu Kong |
MURI/AUSMURI University
| User Name | TBD |
| University | Virginia Tech |
| Address | 1145 Perry St, Blacksburg, VA, 24061 |
| Acknowledgement | TBD |
Hardware
| Available Hardware | TBD |
| Accessibility | TBD |
| Contact link | TBD |
Ex-situ Characterization Data Template
| Sample ID | TBD |
| Process ID | TBD |
| Characterization Type | TBD |
| Characterization Instrument | TBD |
| Ex-situ Measurement Details | TBD |
In-situ Characterization Data Template
| Sample ID | TBD |
| Process ID | TBD |
| Characterization Type | TBD |
| Characterization Instrument | Virginia Tech Smart Group Customized Ultra-high Spatial Resolution SLS 3D scanner |
| In-situ Measurement Details | TBD |