PM-HIP PWHT SA508 Grade 3 Stitched Micrographs and Nanoindentation Profile
Description
This dataset contains a series of micrographs, both raw and processed, as well as a large scale stitched micrograph covering the span of an electron beam weld in PM-HIP SA508 Grade 3 RPV steel. The dataset also contains a series of plain-text CSV files containing load-displacement data for a nanoindentation profile covering the same weld in the same direction.
Files
Steps to reproduce
Specimens were prepared for imaging by polishing with Diamat slurry down to 1 micron, and then etching with 2% Nital. Imaging was done using a Thermo-Scientific Helios SEM, with an accelerating voltage of of 5 kV and a beam current of 0.4 nA. Each micrograph overlaps slightly with the previous one in the profile in order to enable image stitching, with the total spacing per image being roughly 140 microns. The nanoindentation data was collected by placing a series of 2x2 indent grids, with a grid spacing of 100 µm, a depth of 3 µm, and an indent rate of 0.2 nm/s in 1 mm increments in order to create a profile centered on the center of the weld.