Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction
Published: 15 October 2020| Version 1 | DOI: 10.17632/5ks69cckkp.1
Contributor:
Sigurd Wenner
Description
ICPMS, SIMS, TEM, STEM and EELS data from the publication "Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction".
Files
Institutions
SINTEF
Categories
Inductively Coupled Plasma Mass Spectrometry, Transmission Electron Microscopy, Secondary Ion Mass Spectrometry