Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction

Name: Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction
Creator: Sigurd Wenner
Published: 2020-10-15T21:34:59.800Z
Keywords: Inductively Coupled Plasma Mass Spectrometry, Transmission Electron Microscopy, Secondary Ion Mass Spectrometry

Wenner, Sigurd

doi:10.17632/5ks69cckkp.1

Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction

Published: 15-10-2020| Version 1 | DOI: 10.17632/5ks69cckkp.1

Contributor:

Sigurd Wenner

Description

ICPMS, SIMS, TEM, STEM and EELS data from the publication "Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction".

Copper enrichment on aluminium surfaces after electropolishing and its effect on electron imaging and diffraction

Description

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