OTS SAMs

Published: 29 April 2021| Version 1 | DOI: 10.17632/6mb8jhcwz2.1
Contributor:
Lucel Sirghi

Description

AFM image of compact OTS SAM on bare silicon substrate showing the OTS film thickness and height histograms of smooth OTS film surfaces used to determine the OTS RMS roughness

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Categories

Applied Sciences

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