Processed data for Table 2 - Bacon et al Potentially detrimental effects of carbon contamination on beryllium

Published: 1 March 2018| Version 1 | DOI: 10.17632/7y5n9wcryh.1
Contributor:
Simon Bacon

Description

Section analysis data of images for determining layer thickness and Volta potential difference

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Institutions

University of Surrey

Categories

Atomic Force Microscopy

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