Processed data for Table 2 - Bacon et al Potentially detrimental effects of carbon contamination on beryllium
Published: 1 March 2018| Version 1 | DOI: 10.17632/7y5n9wcryh.1
Contributor:
Simon Bacon
Description
Section analysis data of images for determining layer thickness and Volta potential difference
Files
Institutions
University of Surrey
Categories
Atomic Force Microscopy