Rietveld Refinement ZnO powders (Fullprof)

Published: 17 January 2022| Version 2 | DOI: 10.17632/9zz7khmzfx.2
Contributor:
Ricardo Lozano Rosas

Description

The authors calculated a complete lattice parameters characterization by Rietveld refinement using Fullprof suite software. Input information, such as cell parameters, atomic positions, and space groups, was collected from the International Centre for Diffraction Data (ICDD) PDF-4+2015 database. The background was modeled by a 5-coefficient polynomial approach and the Pseudo-Void function was used in the profile. The folder contains three files, these files can be opened by notepad app or text software.

Files

Steps to reproduce

In order to read the Rietveld information is necessary open single files with notepad application or any text processing software.

Institutions

Benemerita Universidad Autonoma de Puebla Instituto de Ciencias

Categories

X-Ray Diffraction, Rietveld Refinement

License