Data for: spectroscopic ellipsometric study of bifunctional urethane methacrylate perfluoropolyether (PFPE) and polyvinylidene fluoride (PVDF)

Published: 1 July 2021| Version 2 | DOI: 10.17632/bwtzc9rzb9.2
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Description

Two types of datasets are provided within this repository for the fluoropolymers bifunctional urethane methacrylate perfluoropolyether (PFPE) and polyvinylidene fluoride (PVDF), as contained within a subfolder as categorised by material type, and complete with their respective dataset description text files. Firstly, the experimentally measured (real) indices of refraction data of the PFPE substrate and PVDF thin-film samples, as determined from the ellipsometric study, over the spectral range 300 nm to 1000 nm, experimentally measured with a resolution of 10 nm. The data were modelled using a single isotropic Cauchy optical constants function based layer using incidence angles of 65°, 70°, and 75°. Secondly, data is presented for the experimentally measured, and subsequently corrected using the Fresnel equations, optical transmissivity spectra of the PFPE substrate and PVDF thin-film samples, as determined from the ellipsometric study over the spectra range of 300 nm to 1000 nm measured with a resolution of 1 nm. The determined optical absorption coefficient of the PFPE substrate and PVDF thin-film samples, as calculated from the transmission intensity data over the same spectral range of 300 nm to 1000 nm, is also presented. Note: the data deposited here, which have been made publically available via Mendeley Data as to comply with the interests of openly sharing data, relate to the figures found within the data article we have submitted to the Data in Brief journal: J. Gibbons, S.B.H. Patterson, A. Zhakeyev, F. Vilela, J. Marques-Hueso, Spectroscopic ellipsometric study datasets of the fluorinated polymers: bifunctional urethane methacrylate perfluoropolyether (PFPE) and polyvinylidene fluoride (PVDF), Data Br. In Press.

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Institutions

Heriot-Watt University

Categories

Plastics, Fluoropolymer, Photoluminescence, Refractive Index, Optical Characterization of Thin Film, Ellipsometry

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