PARPLE: Detailed automatized and parallel evaluation of luminescence mappings

Published: 01-01-2015| Version 1 | DOI: 10.17632/c6hnxxkgmr.1
Contributor:
Hendrik Sträter

Description

This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018) Abstract Laterally resolved luminescence techniques offer the possibility to examine thin film semiconductors with respect to the inhomogeneities of their opto-electronic, optical and chemical properties. Especially the integrated photoluminescence (PL) yield and splitting of quasi-Fermi levels (QFL) are of interest as well as the derived optical properties like the optical band gap, the Urbach energy and the absorption due to defect states within the band gap. For a large set of individual PL spectra... Title of program: PARPLE Catalogue Id: AEWJ_v1_0 Nature of problem Evaluation of PL spectra and extraction of opto-electronic properties including integrated PL yield, splitting of quasi-Fermi levels and optical band gap. The spectral shift of the PL spectra is covered by use of an adaptive fit procedure. Versions of this program held in the CPC repository in Mendeley Data AEWJ_v1_0; PARPLE; 10.1016/j.cpc.2015.03.017

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