Growth, Characterization, and Photovoltaic Application of Copper Oxide Thin Films

Published: 31 August 2021| Version 1 | DOI: 10.17632/d454bcyd6x.1
Contributors:
Yuri Ribeiro,
,
,

Description

These are experimental data for the characterization of cuprous and cupric oxide, grown as thin films by electrodeposition. There are results for XRD, XPS (valence band measurement), SEM, EDS, Raman Spectroscopy, Optical Spectroscopy, Electrochemical Voltammetry and related techniques. Also, there are some theoretical results, calculated from DFT.

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Institutions

Instituto Federal de Educacao Ciencia e Tecnologia da Bahia

Categories

Physics, Semiconductor, Thin Film, Electrodeposition, Physics of Semiconductor Device, Solid State Physics

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