Insights into Capacitance Variance Mechanisms via a Machine Learning Biased-Evolutionary Approach

Name: Insights into Capacitance Variance Mechanisms via a Machine Learning Biased-Evolutionary Approach
Creator: Venkatesh Meenakshisundaram
Published: 2020-09-14T21:07:09.610Z
Keywords: Dielectrics, Finite Element Modeling

Meenakshisundaram, Venkatesh; Yoo, David; Gillman, Andrew; Mahoney, Clare; Deneault, James; Glavin, Nicholas; Buskohl, Philip

doi:10.17632/d6hm3bs4jf.1

Insights into Capacitance Variance Mechanisms via a Machine Learning Biased-Evolutionary Approach

Published: 14 September 2020| Version 1 | DOI: 10.17632/d6hm3bs4jf.1

Contributors:

Venkatesh Meenakshisundaram, David Yoo, Andrew Gillman, Clare Mahoney, James Deneault, Nicholas Glavin, Philip Buskohl

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Dielectric particle properties and packing configuration of every system tested by the optimization process.

Insights into Capacitance Variance Mechanisms via a Machine Learning Biased-Evolutionary Approach

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