Efficient kinematical simulation of reflection high-energy electron diffraction streak patterns for crystal surfaces

Published: 01-10-2011| Version 1 | DOI: 10.17632/dk7w4jwg7d.1
Kangkang Wang,
Arthur R. Smith


Abstract An efficient program with a user-friendly graphical interface has been developed for simulating reflection high-energy electron diffraction patterns obtained on crystal surfaces. The calculations are based on a kinematical approach which considers single electron scattering events at the surface. This time-efficient approach is in most cases sensitive enough for distinguishing different structural models, even if they differ very subtly. The results are presented in realistic two-dimensional ... Title of program: RHEEDsim Catalogue Id: AEJC_v1_0 Nature of problem Reflection high-energy electron diffraction (RHEED) has been widely used in studying crystal surface structures all over the world, especially in combination with ultra-high vacuum molecular beam epitaxy systems. In addition to determining the surface smoothness, RHEED is also a very useful tool in studying surface reconstructions, which are often encountered at the growth surfaces of semiconductors and alloys. While the positions of the fractional streaks can be used to determine the basic info ... Versions of this program held in the CPC repository in Mendeley Data AEJC_v1_0; RHEEDsim; 10.1016/j.cpc.2011.04.023 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018)