High speed and high spatial resolution IR imaging data for single spot melting
Published: 13 April 2021| Version 1 | DOI: 10.17632/dkgmybmc84.1
Contributor:
Description
This dataset including the high-speed and high-spatial resolution IR data for single spot ti-6-4 melting. The high speed dataset was captured by Telops m3k high speed camera with 20kHz frame rate and 30um spatial resolution. The high spatial dataset was captured by Micro-Epsilon M1 IR camera with 1kHz frame rate and 8um spatial resolution. The details description is included inside the folder
Files
Steps to reproduce
The data was captured during the single spot melting of Ti64 material experiments performed in APS Argonne National Lab Beam 32 ID-B. The high speed IR camera was located outside of the chamber and the high spatial resolution IR camera was located inside of the chamber.
Institutions
Virginia Polytechnic Institute and State University, University of Tennessee Knoxville
Categories
Infrared Imaging
Funding
TBD
Computational Modelling
| Objective of the Model | TBD |
| Typical Input | TBD |
| Typical output | TBD |
| Computer System Requirements | TBD |
| Simulation ID | TBD |
Patents
| Patent Title | TBD |
| Patent Application | TBD |
AM Sample Data Template
| Sample ID | TBD |
| Date | 2020-02-21T17:00:00.000Z |
| Alloy Type | Ti-Base |
| Alloy composition | TBD |
| Alloy certificate | TBD |
| Process ID | TBD |
AM Process Data Template
| Additive Manufacturing Process | L-PBF |
| Process Parameters | TBD |
| Process Date | 2020-02-21T17:00:00.000Z |
| Process Description | TBD |
| CAD File | TBD |
| Process ID | TBD |
Research Process Flow
| Process Flow for Additive Manufacturing | TBD |
| Process Flow for Ex-situ Characterization | TBD |
| Process Flow for In-situ Characterization | TBD |
| Process Flow for Computational Modeling | TBD |
Software
| Available Software | RevielIR |
| Type | Commercial |
| Contact link | TBD |
Publications
| Sample ID | TBD |
| Process ID | TBD |
| Publication Title | TBD |
| Citation | TBD |
| Authors | Rongxuan Wang, David Garcia, Zhenyu Kong |
MURI/AUSMURI University
| User Name | Rongxuan Wang |
| rxwang@vt.edu | |
| University | Virginia Tech |
| Address | 1145 Perry St, Blacksburg, VA, 24061 |
| Acknowledgement | TBD |
Hardware
| Available Hardware | Telops M3K, Micro-epsilon M1 |
| Accessibility | TBD |
| Contact link | TBD |
Ex-situ Characterization Data Template
| Sample ID | TBD |
| Process ID | TBD |
| Characterization Type | TBD |
| Characterization Instrument | TBD |
| Ex-situ Data ID | TBD |
| Ex-situ Measurement Details | TBD |
In-situ Characterization Data Template
| Sample ID | TBD |
| Process ID | TBD |
| Characterization Type | TBD |
| Characterization Instrument | TBD |
| In-situ Measurement Details | TBD |