Experimental data for the article: "Statistical model of micromosaics and lattice parameter distribution along a single-crystal: Application to an analysis of Ca9Y(VO4)7, REVO4 (RE = Nd, Ho, Er) and GaN"

Published: 1 July 2025| Version 1 | DOI: 10.17632/dnv6xdprg2.1
Contributors:
Adrian Sulich,

Description

The dataset contains the results of high-resolution X-ray diffraction (HR XRD) study of Ca9Y(VO4)7, REVO4 (RE = Nd, Ho, Er) and GaN single-crystals. The measurements carried out include Rocking Curves (RC) and 2Theta-Omega (TT) scans of the symmetrical reflections (0030, 600, 004) recorded point-by-point along the sample's surface (in the direction assigned as X or Y). The results were applied as real data for testing mathematical model of extended defects distribution along a single-crystal. This model is proposed as a tool to describe and compare crystallographic quality of miscellaneous samples in a set. It is presented in the article manuscript: "Statistical model of micromosaics and lattice parameter distribution along a single-crystal: Application to an analysis of Ca9Y(VO4)7, REVO4 (RE = Nd, Ho, Er) and GaN" .

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Categories

Single Crystal X-Ray Diffraction, Crystalline Material, Crystallographic Defect

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