Dataset of Optoelectrical properties of electrodeposited silver nanowire network transparent conducting electrodes and Cu(In, Ga)Se2 thin-film solar cells
Description
The dataset was generated to offer detailed information on optoelectrical properties of electrodeposited silver nanowire network transparent conducting electrode and thin film solar cell performance vs. electrodeposition time. The dataset can be helpful to develop the electrodeposition process and achieve the improved properties of a thin film solar cell.
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Steps to reproduce
Total transmittance was measured by a UV-Vis spectrometer (Shimadzu, UV-2600) equipped with an integrating sphere (Shimadzu, ISR-2600 Plus). Specular transmittance was measured by UV-Vis spectrometer (Scinco, Genesys 10S Vis). Sheet resistance was measured using the four-probe method (Dasol Eng, FPP-40K). The J-V characteristics were measured using a source meter (Keithley, 2401) with a solar simulator (Abet Technologies, 11002 SunLite).