high resolution 3D point cloud data on electrical beam melting Ti64 surface
Published: 13 April 2021| Version 1 | DOI: 10.17632/dvxxnwfcnx.1
Contributor:
Description
The sample part has surface dimensions of 15 by 15 mm^2, using a random scan pattern. The three files are scanned by the white light interferometer (Zygo NewView 8200 ), ultra-high-resolution structured light 3D scanner (SLS) (customized), and professional SLS (HP 3D STRUCTURED LIGHT SCANNER PRO S3). The spatial resolutions are 2 microns, 5 microns, and 48 microns, respectively. The scanning times are 10hrs, 4 seconds, and 4 seconds, respectively.
Files
Steps to reproduce
interferometer, 10X objective 3x CSI, z:normal, z_scan:300 um,512x512 pix, 4% stitch overlapping, dx,dy:1.630 um ultra-high spatial resolution SLS: 3000*4000 pixel dual camera, 720p projector, 15*20mm^2 FOV HP SLS: 60mm calibration target
Institutions
Virginia Polytechnic Institute and State University
Categories
Point Cloud
Funding
TBD
Computational Modelling
| Objective of the Model | TBD |
| Typical Input | TBD |
| Typical output | TBD |
| Computer System Requirements | TBD |
| Simulation ID | TBD |
Patents
| Patent Title | TBD |
| Patent Application | TBD |
AM Sample Data Template
| Sample ID | R7 |
| Date | 2021-04-02T16:00:00.000Z |
| Alloy Type | Ti-Base |
| Alloy composition | TBD |
| Alloy certificate | TBD |
| Process ID | TBD |
AM Process Data Template
| Additive Manufacturing Process | EBM |
| Process Parameters | TBD |
| Process Date | 2021-04-02T16:00:00.000Z |
| Process Description | TBD |
| CAD File | TBD |
| Process ID | TBD |
Research Process Flow
| Process Flow for Additive Manufacturing | TBD |
| Process Flow for Ex-situ Characterization | TBD |
| Process Flow for In-situ Characterization | TBD |
| Process Flow for Computational Modeling | TBD |
Software
| Available Software | TBD |
| Type | Commercial |
| Contact link | TBD |
Publications
| Sample ID | TBD |
| Publication Title | TBD |
| Citation | TBD |
| Authors | Rongxuan Wang |
MURI/AUSMURI University
| User Name | Rongxuan Wang |
| rxwang@vt.edu | |
| University | Virginia Tech |
| Address | TBD |
| Acknowledgement | TBD |
Hardware
| Available Hardware | TBD |
| Accessibility | TBD |
| Contact link | TBD |
Ex-situ Characterization Data Template
| Sample ID | TBD |
| Process ID | TBD |
| Characterization Type | TBD |
| Characterization Instrument | TBD |
| Ex-situ Measurement Details | TBD |
In-situ Characterization Data Template
| Sample ID | TBD |
| Process ID | TBD |
| Characterization Type | TBD |
| Characterization Instrument | TBD |
| In-situ Measurement Details | TBD |