Data for: Measurement of the optical dielectric properties of thin- lm materials by ultrafast time-resolved interferometry

Published: 04-02-2020| Version 1 | DOI: 10.17632/fbv9gjdxn3.1
Contributors:
Haiying Song,
Qi Ge,
Shi-Bing Liu,
Mei-Rong Lu,
Ya-Chao Li,
Elshaimaa Emara,
Peng Wang

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these are the principle, the sample in the expriment used in this article and the data processing, also the set-up used in this expriment

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