Scattered light pattern simulations for non-defective InGaN-samples

Published: 8 October 2026| Version 1 | DOI: 10.17632/fzjpz6p9v6.1
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Description

The dataset consists of a total of 120 scattered light intensity simulations of non-deffective InGaN nanowire samples. Each file contains the data from one simulation run. The simulations were carried out using the setup described in the citing publication and covered a section of the scattered light sphere comprising 180 x 180 measurement points with a step size of 0.5° in elevation and azimuth direction. The intensities are captured in auxiliary units, since only the intensity relation between the measurement positions is of interest. The simulation parameters and the simulation procedure can be found in the citing publication.

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Steps to reproduce

The simulation parameters and procedure are described in the citing publication.

Institutions

Categories

Engineering, Optical Metrology

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