Data for: An Analytical Simulation Method for X-ray Fluorescence Computed Tomography
Published: 16 January 2020| Version 1 | DOI: 10.17632/g32jf5s48m.1
Luc Van Hoorebeke,
Matthieu N. Boone,
The compressed file attached above contains comparison of fluorescence sinogram of Fe-K-alpha line collected from a laboratory-based XFCT scanner and that simulated by the analytical simulator reported hereby at 120 projection angles along 360 degrees. With access to such dataset, reviewers and potential readers could have a better understanding of the accuracy of the reported simulation method.