Data for: An Analytical Simulation Method for X-ray Fluorescence Computed Tomography

Published: 16-01-2020| Version 1 | DOI: 10.17632/g32jf5s48m.1
Contributors:
Bo Gao,
Luc Van Hoorebeke,
Matthieu N. Boone,
Brecht Laforce,
Laszlo Vincze,
Jelle Dhaene

Description

The compressed file attached above contains comparison of fluorescence sinogram of Fe-K-alpha line collected from a laboratory-based XFCT scanner and that simulated by the analytical simulator reported hereby at 120 projection angles along 360 degrees. With access to such dataset, reviewers and potential readers could have a better understanding of the accuracy of the reported simulation method.

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