Datasets for the analysis of dislocations at grain boundaries and during vein formation in cyclically deformed Ni micropillars
Strain map obtained from Pillar G1
Steps to reproduce
FEI Tecnai G2 (200 kV FEG) Transmission Electron Microscopy (TEM), nanobeam precession diffraction (PD) patterns. For obtaining the PED strain maps an electron probe of size ~4 nm was used with a step size of 40 nm and a precession angle of 0.5°. The samples were aligned along the  zone axis.