Datasets for the analysis of dislocations at grain boundaries and during vein formation in cyclically deformed Ni micropillars

Published: 13 August 2019| Version 1 | DOI: 10.17632/g8y7fj9mr8.1
Contributors:
Vahid Samaee,
Stefan Sandfeld

Description

Strain map obtained from Pillar G1

Files

Steps to reproduce

FEI Tecnai G2 (200 kV FEG) Transmission Electron Microscopy (TEM), nanobeam precession diffraction (PD) patterns. For obtaining the PED strain maps an electron probe of size ~4 nm was used with a step size of 40 nm and a precession angle of 0.5°. The samples were aligned along the [100] zone axis.

Institutions

Universiteit Antwerpen

Categories

Transmission Electron Microscopy, Deformation Microstructures, Mapping, Strain

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