Data for: Scattering Intensity Distribution Dependence on Collection Angles in Annular Dark-Field STEM-in-SEM Images

Published: 29 August 2018| Version 1 | DOI: 10.17632/gdxwhx4btj.1
Contributor:
Jason Holm

Description

Supplementary information including raw images in *.avi format and raw data calculated from those images and system geometry.

Files

Categories

Electron Microscopy, Analytical Electron Microscopy

License