Datasets on materials research of hard ferromagnet in TM-Fe-Si (TM=Ti, Zr, Hf, V, Nb, and Ta) ternary systems

Published: 21 December 2022| Version 2 | DOI: 10.17632/gp8rkw2k6v.2
Jiro Kitagawa,


The datasets presented are related to materials research on hard ferromagnet in TM-Fe-Si (TM=Ti, Zr, Hf, V, Nb, and Ta) ternary systems. The motivation for data collection is based on the research paper entitled “Novel hard magnetic phase with Zr11.5Fe53Si35.5 composition”. The datasets are composed of scanning electron microscope images, X-ray diffraction (XRD) patterns, and magnetization data for TM7Fe52Si41 annealed at 1050 ℃. The chemical compositions of constituent phases were determined by an energy dispersive X-ray spectrometer (EDS). The phase analysis was performed using XRD and EDS results. The Curie temperature of each sample was obtained using magnetization data, and the coercive field was determined for hard ferromagnet samples Zr7Fe52Si41 and Hf7Fe52Si41. The datasets would be useful for developing an Fe-based rare-earth-free permanent magnet, which is one of the central issues of materials science.


Steps to reproduce

Polycrystalline samples with a mass of 1.5 g were synthesized by a home-made arc furnace using constituent elements Ti (99.9 %), Zr (99.5 %), Hf (98 %), V (99.9 %), Nb (99.9 %), Ta (99.9 %), Fe (99.9 %), and Si (99.999 %) under Ar atmosphere. The atomic ratio was TM (=Ti, Zr, Hf, V, Nb, or Ta) : Fe : Si =7 : 52 : 41. The button-shaped samples were remelted several times on a water-cooled Cu hearth and flipped each time to ensure homogeneity. Each as-cast sample was subsequently placed in an evacuated quartz tube and annealed at 1050 ℃ for one day, followed by an air-coolig in an electric furnace. Room temperature X-ray diffraction (XRD) patterns of annealed samples were collected using an X-ray diffractometer (XRD-7000L, Shimadzu) with Cu-Kα radiation in Bragg-Brentano geometry. The phase analysis was carried out using a field emission scanning electron microscope (FE-SEM, JSM-7100F, JEOL). After checking the SEM images, the chemical composition in each area (~ 5μm × 5μm) was measured by an energy dispersive X-ray spectrometer (EDS) equipped with the FE-SEM. The chemical composition was determined by averaging several data collection points. The temperature dependence of dc magnetization χdc (T) between 50 and 400 K was measured using a vibrating sample magnetometer (VSM) option in VersaLab (Quantum Design). The high-temperature χdc (T) from 400 K to 800 K was measured by another VSM (TM-VSM33483-HGC, Tamakawa). In each measurement, the external field (H) was 100 Oe. The isothermal magnetization (M) curves between H=-30 kOe and H=30 kOe at 50 K, 100 K, 200 K, 300 K, and 400 K were measured using the VSM option of VersaLab.


Fukuoka Kogyo Daigaku


Materials Science