Data for: Ferromagnetic and FMR properties of the YIG/TiO2/PZT structures obtained by ion-beam sputtering

Published: 27 June 2020| Version 1 | DOI: 10.17632/gzxrbk8nsp.1
Sergei Sharko, A.I. Stognij, A. Maziewski, R. Gieniusz, M.N. Smirnova, N.N. Novitskii, V.A. Ketsko, A.I. Serokurova


Fig. 1. Cross-section of the original ceramic PbZr0.45Ti0.55O3 sample. Fig. 2. Typical view of the YIG (2 µm) /TiO2 (0.2 µm) /PZT (400 µm) sample in the cross-sectional area (a), as well as a YIG surface part (b), made on a smaller scale. Fig. 3. X-ray diffraction pattern of the Y3Fe5O12 (2 m) /TiO2 (0.2 m) /PZT (400 m) heterostructure. X-rays are directed to the Y3Fe5O12 layer. Fig. 4. AFM profile (a) along the horizontal line at (b). AFM (b) and MFM (c) images of the surface of the YIG/TiO2/PZT structure in the saturation state. The color scale on the right in the figure 4 c is plotted in relative units. Fig. 5. Magnetic-field dependence of the YIG (2 μm) /TiO2 (0.2 μm) /PZT (400 μm) structure in a parallel (1) and perpendicular (2) configuration of the external magnetic field and the plane of the layer. Measurements were taken at 300 K. The insert is the same on a larger scale. Fig. 6. FMR curves of the YIG (2 μm) /TiO2 (0.2 μm) /PZT (400 μm) structure samples in a resonant magnetic field parallel (a) and perpendicular (b) to the plane of the layer. Measurements were taken of four parts of the same sample. H is the resonance absorption line width.



Materials Science, Applied Physics, Ferromagnetic Material, Thin Film, Ferromagnetism, Film Deposition, Film Growth, Ceramic Surface