Data for: Fabrication of bimorph lead zirconate titanate thick films on metal substrates via the cold sintering process
Published: 26 April 2021| Version 1 | DOI: 10.17632/hdmfs9x5vz.1
Contributor:
Dixiong WangDescription
"PZT on Cu post anneal T XRD" is the raw data for the XRD of PZT on Cu. "PZT on Cu tape C-D" is the dielectric permittivity-loss of PZT on Cu. "Dixiong Wang EDS_Site 3_Ti K series" is the EDS line scan of as cold sintered PZT on Cu. "Dixiong Wang EDS_post sinter Site 2_Ti K series" is the EDS line scan of cold sintered and 800 C post-annealed PZT on Cu. "PZT on Ni C-D" is the permittivity-loss vs frequency of cold sintered and 700 C post-annealed PZT on LNO/HfO2/Ni. "LNO_HfO2_Ni 700_900C XRD" is the XRD of LNO/HfO2/Ni foil annealed at different temperatures.
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X-Ray Diffraction, Energy-Dispersive X-Ray Spectroscopy, Permittivity