RHEED intensities from two-dimensional heteroepitaxial nanoscale systems

Published: 1 January 2014| Version 1 | DOI: 10.17632/hh4ym65vtv.1
Contributor:
Andrzej Daniluk

Description

Abstract A practical computing algorithm has been developed for calculating the reflection high-energy electron diffraction (RHEED) from the molecular beam epitaxy growing surface. The calculations are based on the use of the dynamical diffraction theory in which the electrons are taken to be diffracted by a potential, which is periodic in the dimension perpendicular to the surface. The computer program presented in this paper enables calculations for three basic types of diffuse potential for crystal... Title of program: RHEED_DIFF Catalogue Id: AETW_v1_0 Nature of problem RHEED rocking curves (the specular beam intensities versus the glancing angle) recorded from heteroepitaxial layers are used for the non-destructive evaluation of epilayer thickness and composition with a high degree of accuracy. Rocking curves from such heterostructures are often very complex because the thickness fringes from every layer beat together. Simulations based on the dynamical diffraction theory are generally used to interpret the rocking curves of such structures from which very sma ... Versions of this program held in the CPC repository in Mendeley Data AETW_v1_0; RHEED_DIFF; 10.1016/j.cpc.2014.07.003 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018)

Files