Data for: Information Depth in Backscattered Electron Microscopy of Nanoparticles Within a Solid Matrix

Published: 9 February 2018| Version 1 | DOI: 10.17632/hrh6m7zswn.1
Contributors:
Gilles Bourret,
Schwarz Sabine,
Johannes Österreicher,
Andreas Schiffl,
Florian Grabner

Description

This file contains: Simulated line scans of the backscattered electron signals obtained from Monte Carlo simulations for different nanoparticle sizes, depth and accelerating voltages (used for Figure 4) Experimental diameters measured from SEM and TEM micrographs

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