Data for: Information Depth in Backscattered Electron Microscopy of Nanoparticles Within a Solid Matrix

Name: Data for: Information Depth in Backscattered Electron Microscopy of Nanoparticles Within a Solid Matrix
Creator: Gilles Bourret
Published: 2018-02-09T07:18:25.003Z
Keywords: Materials Science

Bourret, Gilles; Sabine, Schwarz; Österreicher, Johannes; Schiffl, Andreas; Grabner, Florian

doi:10.17632/hrh6m7zswn.1

Data for: Information Depth in Backscattered Electron Microscopy of Nanoparticles Within a Solid Matrix

Published: 9 February 2018| Version 1 | DOI: 10.17632/hrh6m7zswn.1

Contributors:

Gilles Bourret, Schwarz Sabine, Johannes Österreicher, Andreas Schiffl, Florian Grabner

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This file contains: Simulated line scans of the backscattered electron signals obtained from Monte Carlo simulations for different nanoparticle sizes, depth and accelerating voltages (used for Figure 4) Experimental diameters measured from SEM and TEM micrographs

Data for: Information Depth in Backscattered Electron Microscopy of Nanoparticles Within a Solid Matrix

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