Reflectivity data for "Structure-Property Relationships at Nafion Thin-film Interfaces: Thickness Effects on Hydration and Anisotropic Ion Transport"

Published: 24 September 2017| Version 1 | DOI: 10.17632/jfb9hv4nrh.1
Steven DeCaluwe,
Joseph Dura,
Andrew Baker,
Pavan Bhargava,
John Fischer


Reflectivity data collected on Nafion thin films (thickness ranging from 5-153 nm). File names give the "effective Nation thickness" (i.e. the thickness if all the water were removed; t5 = "equivalent Nafion thickness of 5 nm), plus the vapor environment (vh = "vapor hydrogen," vd = "vapor deuterium", both at 92% RH in Ar carrier gas, Ar = "Argon,' 0% RH).


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Collected on AND/R at the NIST Center for Neutron Research. Films spin-cast from dilution in Ethanol for well controlled thickness. Data reduced using ReflRed software.