Effect of Chemical Post-Processing on Surfaces and Sub-Surface Defects in Electron Beam Melted Ti-6Al-4V.

Name: Effect of Chemical Post-Processing on Surfaces and Sub-Surface Defects in Electron Beam Melted Ti-6Al-4V.
Creator: Viktor Sandell
Published: 2022-03-04T15:53:35.563Z
Keywords: Microscopy, Computed Tomography, Interferometry

Sandell, Viktor

doi:10.17632/kzbtdvdmx8.1

Effect of Chemical Post-Processing on Surfaces and Sub-Surface Defects in Electron Beam Melted Ti-6Al-4V.

Published: 4 March 2022| Version 1 | DOI: 10.17632/kzbtdvdmx8.1

Contributor:

Viktor Sandell

Description

The data consists of the unprocessed (RAW) XCT files for the square bars specimens as well as interferometry files and all microscopy images (SEM and Optical). No closer sorting has been made but most data should be self-explanatory.

Files

Institutions

Lulea Tekniska Universitet

Effect of Chemical Post-Processing on Surfaces and Sub-Surface Defects in Electron Beam Melted Ti-6Al-4V.

Description

Files

Institutions

Categories

Licence