Non-contact measurement of the thickness of a surface film using a superimposed ultrasonic standing wave

Published: 05-08-2020| Version 3 | DOI: 10.17632/mcg9xtmzjw.3
Contributors:
Joseph Kanja,
Robin Mills,
Xiangwei Li,
Andrew Hunter,
Henry Brunskill,
Rob Dwyer-Joyce

Description

This data provides the reader with a sample of raw data and processed data which was used for the measurement of surface film thickness using a superimposed ultrasonic standing wave. The reader is advised to refer to the research article "Non-contact measurement of the thickness of a surface film using a superimposed ultrasonic standing wave" for more information on this data and how to interpret it.

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