The thickness layer measurement
Description
The measurement process using SEM Cross-section for samples S1, S2, S3, and S4. Sample S4 were are not using preheating before the pouring process, which obtained an average thickness value of 0.011mm from ten measurements, while the deviation value was 1.72mm (Fig. 7a). SEM Cross-section analysis results for S1 samples using 500OC preheating temperature is an analysis of the position of the cross-section with an average thickness distance of 0.012mm from 10 measurements and a deviation value of 0.001mm. Measurements were made on the white layer area, as shown in Figure 7b. The results for S2 samples with a preheating temperature of 700OC obtained an average thickness of coating layer of 0.015mm from 10 measurements and a deviation value of 1.165mm. Measurements were made on the white layer area (Fig. 7c). The results for sample S3 using a preheating temperature of 900OC obtained an average layer thickness on the white layer at the edge of the surface areas, reaching 0.020mm from 10 measurements to obtain the average value. The deviation value is 0.001mm, as shown in Figure 7d. Figure 7. The thickness layer analysis by cross-section testing. (a) Thickness layer of the sample not using preheating process (S4), (b) Thickness layer of the sample by using temperature preheating 500OC (S1), (c) The thickness layer of the sample by using temperature preheating 700OC (S2), (d) Tthe thickness layer of the sample by using temperature preheating 900OC (S3).
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The coating layer's thickness on the surface measured by cross-section proses. Furthermore, the measurement process for the diffusion thickness layer was processed by ImageJ, then measurements were taken ten times to take the average value. SEM-EDX type used is JEOL - JSM-6510LA under a voltage of 20 kV and a working distance of 16mm. Analysis samples for cross-section and target diffusion are taken in the same area as the microhardness test (Fig. 3b).