Self-lubrication of Nuclear Graphite in Argon at High-Temperature - Raw microscopies and Raman, XRD data
Description
Raw micrographs (optical, digital, SEM), raw and peak-fitted Raman spectroscopy data, and raw and peak-fitted X-ray diffraction data of ET-10 graphite samples generated in Ar tribology tests at room temperature and 600°C. Data are described in research article "Self-lubrication of Nuclear Graphite in Argon at High-Temperature" (https://doi.org/10.1016/j.triboint.2022.107946) and in companion data article "Microstructural Characterization Data for Nuclear Graphite Samples Generated During Tribology Testing in Argon" (submitted to Data in Brief).
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Digital micrographs are collected using a Keyence digital microscope VHX-6000 with brightfield coaxial illumination. The microscope has an automated stage and a 3D-Depth Composition module that allow for 3D image acquisition and profilometry. Optical micrographs are collected using a Nikon Eclipse LV150NL microscope. SEM images are collected with a Scios 2 dual beam SEM/FIB. X-ray diffraction (XRD) is performed using a Rigaku MiniFlex 6G diffractometer (150 mm goniometer radius), using Co radiation (Kα=0.179 nm). A divergence slit width of 1.25° is used. Diffraction data are collected in the 2θ range of 10° to 90° with a scanning speed of 2°/min and a step size of 0.01°. Silicon powder (NIST SRM 640e) is used as standard reference material for peak locations and full width at half-maximum. The XRD patterns are background subtracted using a b-spline baseline, normalized, and fitted with Voigt functions using Rigaku Smartlab Studio II. Raman spectra are collected using a Horiba LabRam HR confocal Raman microscope with a 532 nm laser source and optical magnification of 50x. Upon acquisition, the spectra are background-subtracted using an 8-degree polynomial baseline and normalized. For the extraction of microstructure parameters, the spectra are fitted using Lorentzian functions on OriginPro 2021b.