Data for: Characterizing Photovoltaic Backsheet Adhesion Degradation using the Wedge and Single Cantilever Beam Tests, Part I: Field Modules

Published: 22 February 2020| Version 1 | DOI: 10.17632/rzvv9r2szt.1
Contributor:
Kai-tak Wan

Description

This dataset includes additional information about the modules tested in this study, including ground cover at deployment location, notes on field delamination observations, and a 7-digit de-identification code that can be used to cross-reference the modules with other works produced from this study. Note that module makes have been anonymized into single-letter identifiers, to protect the commercial interests of the manufacturers. Additional information may be available, upon request, subject to commercial copyright and confidentiality considerations.

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Institutions

Northeastern University

Categories

Photovoltaics, Adhesion, Encapsulation

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