Data for: Light-Induced-Degradation defect independent of the boron concentration: unifying Admittance Spectroscopy, Photoluminescence and Photoconductance Lifetime Spectroscopy results

Published: 29-02-2020| Version 1 | DOI: 10.17632/s7szz6y3xy.1
Contributor:
Fiacre Rougieux

Description

Defect Density and lifetime of LID defect

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