Data for: Light-Induced-Degradation defect independent of the boron concentration: unifying Admittance Spectroscopy, Photoluminescence and Photoconductance Lifetime Spectroscopy results
Published: 29 February 2020| Version 1 | DOI: 10.17632/s7szz6y3xy.1
Contributor:
Fiacre RougieuxDescription
Defect Density and lifetime of LID defect
Files
Categories
Semiconductor, Solar Cell, Silicon