Slit height smearing correction in small angle X-ray scattering I: Intensity correction program

Published: 1 January 1979| Version 1 | DOI: 10.17632/sj7b4r4kn4.1
Moshe Deutsch


Title of program: CORECTEX Catalogue Id: AASB_v1_0 Nature of problem The use of pinhole collimators in small angle X-ray scattering is impractical due to the low intensity obtained at the detector. Instead, long narrow slits, or their equivalents are used to collimate the beam. Consequently the measured intensity is an integral of the intensity scattered through a range of angles rather than the intensity scattered at the nominal measured angle. ... ADAPTATION SUMMARY: Vol:Year:Page 18:1979:143 "0001 CORECTSP" "Slit height smearing correction in small angl ... Note: adaptation instructions are contained in source code Versions of this program held in the CPC repository in Mendeley Data AASB_v1_0; CORECTEX; 10.1016/0010-4655(79)90095-X This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018)



Crystallography, Computational Physics