Laser assisted rapid local crystallization in amorphous PrDyFeCoB microwires
Description
Supplementary data for article "Laser assisted rapid local crystallization in amorphous PrDyFeCoB microwires" : Cross sections of microwires extracted with different rotation speeds of cooling cylinder and analysed by SEM; TEM patterns; HR TEM structure of the correspondent microwires; magnetic hysteresises in correspondent microwires at 300 K. XRD spectra of the rapidly cooled microwires after quenching (900 °C, 30 min) and before quenching. The image of SEM phase analysis (BSE) in the rapid cooled microwire pooled out at 25 m/s. The EDX-spectrum recorded at the center of microwire before laser irradiation; EDX map of Pr, Dy, Co, Fe distribution through the the transversal cross-section of the microwire; EDX map scanned along the microwire. XPS spectrum of the microwire and high resolution spectra corresponding to Fe, Co, Pr and Dy ions. Local loop of the magnetic hysteresis of the microwire, obtained using a Kerr microscope in as cast microwire; Change in the corresponding domain structure with decreasing field in the negative range from -1.8 Oe to - 10.3 Oe. Hysteresis loops of magnetic moment normalized to saruration magnetic moment at 5 T for same microwire before annealing and after annealing 2 h at 900 °С. Electron diffraction patterns of the as grown and annealed microwire are presented. Distribution of the size of crystalline grains in laser treated area of the microwire.
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Reproducibility of results. Multiple repetition of measurements on several samples showed the same result. Electron micro-diffraction patterns were obtained by means of the high-resolution transmission JEOL electronic microscope (HR TEM) at the accelerating voltage of 200 kV (Fig. S1 in Supplementary data). The X-ray diffraction spectroscopy (XDR) was performed by a Bruker x-ray diffractometer providing 2θ-scanning under Cu Kα1-irradiation (Fig. S2 in Supplementary data). The images of a microstructure of films and energy dispersive X-ray analysis (EDX) were recorded in scanning electron microscope (SEM) Zeiss SUPRA 25. X-ray photo-electron spectroscopy (XPS) using a Specs PHOIBOS 150 MCD electron spectrometer with an Mg cathode (hν = 1253.6 eV) and back scattering electron (BSE) phase analysis of the initial microwires are presented