Laser assisted rapid local crystallization in amorphous PrDyFeCoB microwires
Description
Supplementary data for article "Laser assisted rapid local crystallization in amorphous PrDyFeCoB microwires" contains: Cross sections of microwires extracted with different rotation speeds of cooling cylinder and analysed by SEM; TEM patterns; HR TEM structure of the correspondent microwires; magnetic hysteresises in correspondent microwires at 300 K. XRD spectra of the rapidly cooled microwires after quenching (900 °C, 30 min) and before quenching; The image of SEM phase analysis (BSE) in the rapid cooled microwire pooled out at 25 m/s; The EDX-spectrum recorded at the center of microwire before laser irradiation; EDX map of Pr, Dy, Co, Fe distribution through the the transversal cross-section of the microwire; EDX map scanned along the microwire; XPS spectrum of the microwire and high resolution spectra corresponding to Fe, Co, Pr and Dy ions. Local loop of the magnetic hysteresis of the microwire, obtained using a Kerr microscope in as cast microwire; Change in the corresponding domain structure with decreasing field in the negative range from -1.8 Oe to - 10.3 Oe; Hysteresis loops of magnetic moment normalized to saruration magnetic moment at 5 T for same microwire before annealing and after annealing 2 h at 900 °С; Electron diffraction patterns of the as grown and annealed microwire are presented; Distribution of the size of crystalline grains in laser treated area of the microwire. Electron micro-diffraction patterns were obtained with a high-resolution transmission JEOL electronic microscope (HR TEM) at accelerating voltage of 200 kV. The X-ray diffraction spectroscopy (XDR) was performed by a Bruker X-ray diffractometer providing 2θ-scanning under Cu Kα1-irradiation. The images of microstructure of films, energy dispersive X-ray analysis (EDX), and back scattering electron (BSE) phase analysis of the initial microwires were recorded with a Zeiss SUPRA 25 scanning electron microscope (SEM). X-ray photoelectron spectroscopy (XPS) using a Specs PHOIBOS 150 MCD electron spectrometer with an Mg cathode (hν = 1253.6 eV). Microscopy of the longitudinal Kerr effect and obtaining local loops of magnetic hysteresis were carried out using a NEOARK Neomagnesia Lite BH-753 Kerr microscope with magnetic field up to 1 kOe directed along the main axis of the microwire. The integral magnetic moment of the microwire and its field dependence were recorded in a MPMS XL Quantum design SQUID magnetometer at 300 K. Irradiation of the ytterbium pulsed fiber laser with wave length 1070 nm and maximal power P ~ 20 W was used for the microwire local heating in air. Energy of single pulse was 1 mJ, its duration was 120 ns, and frequency was 25 kHz.
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Reproducibility of results. Multiple repetition of measurements on several samples showed the same result. Electron micro-diffraction patterns were obtained by means of the high-resolution transmission JEOL electronic microscope (HR TEM) at the accelerating voltage of 200 kV (Fig. S1 in Supplementary data). The X-ray diffraction spectroscopy (XDR) was performed by a Bruker x-ray diffractometer providing 2θ-scanning under Cu Kα1-irradiation (Fig. S2 in Supplementary data). The images of a microstructure of films and energy dispersive X-ray analysis (EDX) were recorded in scanning electron microscope (SEM) Zeiss SUPRA 25. X-ray photo-electron spectroscopy (XPS) using a Specs PHOIBOS 150 MCD electron spectrometer with an Mg cathode (hν = 1253.6 eV) and back scattering electron (BSE) phase analysis of the initial microwires are presented