Data for: Overcoming the drawbacks of plastic strain estimation based on KAM

Published: 12 September 2017| Version 2 | DOI: 10.17632/skhsz5bdsr.2
Contributors:
Rickard Shen,
Pal Efsing

Description

Electron backscatter diffraction data sets used in this work. The files named 00, 03, 06, 09, 12 and 15.ctf are from the reference specimens, and the filenames represent the approximate nominal plastic strains applied. The files CRDM1, CRDM2 and DP.ctf represent the weld metal to base metal interface region.

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Categories

Materials Science, Materials Characterization Techniques

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