TID_MOSFET_IXFH220N06T3_FEI_2020
Published: 17 February 2023| Version 1 | DOI: 10.17632/sw2g42g36t.1
Contributor:
Dennis ToufenDescription
TID effects on a TRENCHT3 HiperFET Power MOSFET IXFH220N06T3 obteined on FEI's University Centre: Centro Universitario da FEI in 2020.
Files
Institutions
Centro Universitario da FEI
Categories
Radiation
Funding
FAPESP _ Fundação de Amparo a Pesquisa de São Paulo