Electrical measurements: STRUCTURAL, OPTICAL AND ELECTRICAL BEHAVIOR OF ZINC OXIDE/MWCNT COMPOSITE THIN FILMS

Published: 12 October 2018| Version 1 | DOI: 10.17632/t8vvz6kx67.1
Contributor:
M. J Robles-Aguila

Description

The electrical characterization was done at a low frequency (0.1 Hz), and the system was implemented by means of a Curve Tracer Module, a signal Generator (B & K Precision 4017A), and a two-channel oscilloscope (Tektronix TDS 2012C)

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Electrical Characterization of Thin Film

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